
Proceedings Paper
Terabit/s communications using chip-scale frequency comb sourcesFormat | Member Price | Non-Member Price |
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Paper Abstract
High-speed optical interconnects rely on advanced wavelength-division multiplexing (WDM) schemes. However, while photonic-electronic interfaces can be efficiently realized on silicon-on-insulator chips, dense integration of the necessary light sources still represents a major challenge. Chip-scale frequency comb sources present an attractive alternative for providing a multitude of optical carriers for WDM transmission. In this paper, we give an overview of our recent progress towards terabit communications with chip-scale frequency comb sources. In a first set of experiments, we demonstrate frequency comb generation based on silicon-organic hybrid (SOH) electro-optic modulators, enabling line rates up to 1.152 Tbit/s. In a second set of experiments, we use injection locking of a gain-switched laser diode to enerate frequency combs. This approach leads to line rates of more than 2 Tbit/s. A third set of experiments is finally dedicated to using Kerr nonlinearities in integrated nonlinear microcavities for frequency comb generation. We demonstrate coherent communication using Kerr frequency comb sources, thereby achieving line rates up to 1.44 Tbit/s. Our experiments show that frequency comb generation in chip-scale devices represents a viable approach to terabit communications.
Paper Details
Date Published: 3 March 2015
PDF: 8 pages
Proc. SPIE 9343, Laser Resonators, Microresonators, and Beam Control XVII, 93430E (3 March 2015); doi: 10.1117/12.2087572
Published in SPIE Proceedings Vol. 9343:
Laser Resonators, Microresonators, and Beam Control XVII
Alexis V. Kudryashov; Alan H. Paxton; Vladimir S. Ilchenko; Lutz Aschke; Kunihiko Washio, Editor(s)
PDF: 8 pages
Proc. SPIE 9343, Laser Resonators, Microresonators, and Beam Control XVII, 93430E (3 March 2015); doi: 10.1117/12.2087572
Show Author Affiliations
Christian Koos, Karlsruher Institut für Technologie (Germany)
Tobias J. Kippenberg, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Liam P. Barry, Dublin City Univ. (Ireland)
Larry Dalton, Univ. of Washington (United States)
Wolfgang Freude, Karlsruher Institut für Technologie (Germany)
Juerg Leuthold, Karlsruher Institut für Technologie (Germany)
Joerg Pfeifle, Karlsruher Institut für Technologie (Germany)
Claudius Weimann, Karlsruher Institut für Technologie (Germany)
Matthias Lauermann, Karlsruher Institut für Technologie (Germany)
Tobias J. Kippenberg, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Liam P. Barry, Dublin City Univ. (Ireland)
Larry Dalton, Univ. of Washington (United States)
Wolfgang Freude, Karlsruher Institut für Technologie (Germany)
Juerg Leuthold, Karlsruher Institut für Technologie (Germany)
Joerg Pfeifle, Karlsruher Institut für Technologie (Germany)
Claudius Weimann, Karlsruher Institut für Technologie (Germany)
Matthias Lauermann, Karlsruher Institut für Technologie (Germany)
Juned N. Kemal, Karlsruher Institut für Technologie (Germany)
Robert Palmer, Karlsruher Institut für Technologie (Germany)
Sebastian Koeber, Karlsruher Institut für Technologie (Germany)
Philipp C. Schindler, Karlsruher Institut für Technologie (Germany)
Tobias Herr, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Victor Brasch, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Regan T. Watts, Dublin City Univ. (Ireland)
Delwin Elder, Univ. of Washington (United States)
Robert Palmer, Karlsruher Institut für Technologie (Germany)
Sebastian Koeber, Karlsruher Institut für Technologie (Germany)
Philipp C. Schindler, Karlsruher Institut für Technologie (Germany)
Tobias Herr, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Victor Brasch, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Regan T. Watts, Dublin City Univ. (Ireland)
Delwin Elder, Univ. of Washington (United States)
Published in SPIE Proceedings Vol. 9343:
Laser Resonators, Microresonators, and Beam Control XVII
Alexis V. Kudryashov; Alan H. Paxton; Vladimir S. Ilchenko; Lutz Aschke; Kunihiko Washio, Editor(s)
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