Paper Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9210 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.
Paper Details
Date Published: 10 October 2014
PDF: 8 pages
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921001 (10 October 2014); doi: 10.1117/12.2084771
Published in SPIE Proceedings Vol. 9210:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Stefan P. Hau-Riege; Stefan P. Moeller; Makina Yabashi, Editor(s)
PDF: 8 pages
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921001 (10 October 2014); doi: 10.1117/12.2084771
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Published in SPIE Proceedings Vol. 9210:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Stefan P. Hau-Riege; Stefan P. Moeller; Makina Yabashi, Editor(s)
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