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Proceedings Paper

Scattering of IR and visible radiation from hollow waveguides
Author(s): Reuben Dahan; Jacob Dror; Alexandra Inberg; Nathan I. Croitoru
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Paper Abstract

The scattering phenomenon of infrared and visible radiation from hollow waveguides, made of teflon or fused silica, having Ag and AgI guiding layers, was measured by two methods; Total Integrated Scattered and Backscattering. The root means square roughness was evaluated by both methods. It was found that the roughness of the silver layer is influenced by the substrate. The AgI is the main contributor to roughness and this is a function of its preparation method.

Paper Details

Date Published: 1 May 1995
PDF: 5 pages
Proc. SPIE 2396, Biomedical Optoelectronic Instrumentation, (1 May 1995); doi: 10.1117/12.208424
Show Author Affiliations
Reuben Dahan, Tel Aviv Univ. (Israel)
Jacob Dror, Tel Aviv Univ. (Israel)
Alexandra Inberg, Tel Aviv Univ. (Israel)
Nathan I. Croitoru, Tel Aviv Univ. (Israel)

Published in SPIE Proceedings Vol. 2396:
Biomedical Optoelectronic Instrumentation
James A. Harrington; David M. Harris; Abraham Katzir, Editor(s)

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