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Proceedings Paper

Photoreflectance measurements of indium content in semi-insulating indium-alloyed GaAs bulk substrates
Author(s): S. Ravipati; P. W. Yu; B. E. Taylor; W. C. Mitchel
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Paper Abstract

We report the use of rooni-Lemperature photorefleetance measuremenLs to deLenitine radial arid axial nonuniformity of low levels of indium in 3-inch diameter semi-insulaLing GaAs bulk materials grown by the liquid-encapsulaLed Cochralski method. These resulLs were compared with umc. Types of inhomogeneities are discussed in Lerms of indium segregation and the shape of the solid and liquid interface during crystal growth.

Paper Details

Date Published: 1 August 1990
PDF: 8 pages
Proc. SPIE 1286, Modulation Spectroscopy, (1 August 1990); doi: 10.1117/12.20838
Show Author Affiliations
S. Ravipati, Wright State Univ. (United States)
P. W. Yu, Wright State Univ. (United States)
B. E. Taylor, Wright State Univ. (United States)
W. C. Mitchel, Wright Research and Development Ctr. (United States)

Published in SPIE Proceedings Vol. 1286:
Modulation Spectroscopy
Fred H. Pollak; Manuel Cardona; David E. Aspnes, Editor(s)

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