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Proceedings Paper

Preliminary characterizations of a new hybrid CdTe structure for x-ray dental imaging
Author(s): Francis Glasser; Marc Cuzin; Olivier C. Peyret; Francois Mongellaz; Philippe Rambaud; Michel Ravetto; Bernard Pitault; Andre Salaville; Sylvain Paltrier
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Paper Abstract

A new 2D imaging system structure is being studied in CEA-LETI for medical and industrial applications, beginning with dental applications. It consists of a bulk CdTe:Cl detection medium connected to a 2D electronic read-out circuit using the indium bumps techniques developed for infrared imaging. The feasibility of such a structure was tested first with 64 X 64 pixels, 100 micrometers pitch. The 900 micrometers thick CdTe sample suits well for x rays up to 100 keV. High absorption efficiency and high spatial resolution can be reached together by using this new x-ray detector. Due to the fact that the electric field channelizes the created charges, unlike structures using scintillators, this new structure requires no compromise in defining the thickness of the x-ray detector medium. Characterization was performed with 70 kV x rays from a standard dental x ray source. The performances (linearity, signal-to-noise ratio, spatial resolution) and the images obtained with the first prototypes confirm the advantages of such detectors. Based on these results, a 20 X 30 mm2 imager for dental applications is now being developed by SOFRADIR and CEA- LETI.

Paper Details

Date Published: 8 May 1995
PDF: 12 pages
Proc. SPIE 2432, Medical Imaging 1995: Physics of Medical Imaging, (8 May 1995); doi: 10.1117/12.208364
Show Author Affiliations
Francis Glasser, LETI/CEA (France)
Marc Cuzin, LETI/CEA (France)
Olivier C. Peyret, LETI/CEA (France)
Francois Mongellaz, LETI/CEA (France)
Philippe Rambaud, LETI/CEA (France)
Michel Ravetto, LETI/CEA (France)
Bernard Pitault, SOFRADIR (France)
Andre Salaville, SOFRADIR (France)
Sylvain Paltrier, SOFRADIR (France)

Published in SPIE Proceedings Vol. 2432:
Medical Imaging 1995: Physics of Medical Imaging
Richard L. Van Metter; Jacob Beutel, Editor(s)

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