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Proceedings Paper

Dynamical study of thermal conductivity of nanostructured layers by use of the photoinduced transient thermoelectric effect
Author(s): N. Samuolienė; J. Gradauskas; A. Sužiedėlis; A. Maneikis; M. Treideris
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Paper Abstract

We propose a new fast technique to determine thermal conductivity of a nanostructured material and demonstrate it for porous silicon. Transient thermoelectric voltage is measured after a pulsed laser irradiation, and analysis of the voltage decay time constant and porosity of the structure gives the value of the thermal conductivity. For n-type Si of 70% porosity we obtain the value of 35 W m-1 K-1 what is in good agreement with the results of other investigations The method can be easily applied for any other porous or otherwise structured low-dimensional materials.

Paper Details

Date Published: 22 October 2014
PDF: 5 pages
Proc. SPIE 9421, Eighth International Conference on Advanced Optical Materials and Devices (AOMD-8), 94210C (22 October 2014); doi: 10.1117/12.2083576
Show Author Affiliations
N. Samuolienė, Vilnius Gediminas Technical Univ. (Lithuania)
J. Gradauskas, Vilnius Gediminas Technical Univ. (Lithuania)
Ctr. for Physical Sciences and Technology (Lithuania)
A. Sužiedėlis, Vilnius Gediminas Technical Univ. (Lithuania)
Ctr. for Physical Sciences and Technology (Lithuania)
A. Maneikis, Ctr. for Physical Sciences and Technology (Lithuania)
M. Treideris, Ctr. for Physical Sciences and Technology (Lithuania)


Published in SPIE Proceedings Vol. 9421:
Eighth International Conference on Advanced Optical Materials and Devices (AOMD-8)
Janis Spigulis, Editor(s)

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