
Proceedings Paper
Experiments with a low-cost system for computer graphics material model acquisitionFormat | Member Price | Non-Member Price |
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Paper Abstract
We consider the design of an inexpensive system for acquiring material models for computer graphics rendering
applications in animation, games and conceptual design. To be useful in these applications a system must be able
to model a rich range of appearances in a computationally tractable form. The range of appearance of interest in
computer graphics includes materials that have spatially varying properties, directionality, small-scale geometric
structure, and subsurface scattering. To be computationally tractable, material models for graphics must be
compact, editable, and efficient to numerically evaluate for ray tracing importance sampling. To construct
appropriate models for a range of interesting materials, we take the approach of separating out directly and
indirectly scattered light using high spatial frequency patterns introduced by Nayar et al. in 2006. To acquire
the data at low cost, we use a set of Raspberry Pi computers and cameras clamped to miniature projectors.
We explore techniques to separate out surface and subsurface indirect lighting. This separation would allow
the fitting of simple, and so tractable, analytical models to features of the appearance model. The goal of the
system is to provide models for physically accurate renderings that are visually equivalent to viewing the original
physical materials.
Paper Details
Date Published: 13 March 2015
PDF: 9 pages
Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 939806 (13 March 2015); doi: 10.1117/12.2082895
Published in SPIE Proceedings Vol. 9398:
Measuring, Modeling, and Reproducing Material Appearance 2015
Maria V. Ortiz Segovia; Philipp Urban; Francisco H. Imai, Editor(s)
PDF: 9 pages
Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 939806 (13 March 2015); doi: 10.1117/12.2082895
Show Author Affiliations
Luke Cartwright, Yale Univ. (United States)
David Pitera, Yale Univ. (United States)
David Pitera, Yale Univ. (United States)
Published in SPIE Proceedings Vol. 9398:
Measuring, Modeling, and Reproducing Material Appearance 2015
Maria V. Ortiz Segovia; Philipp Urban; Francisco H. Imai, Editor(s)
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