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Proceedings Paper

Self-induced temperature rise of stack actuators due to dynamic excitation
Author(s): Eric M. Flint; Chen Liang; Craig A. Rogers
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Paper Abstract

The need to be able to predict the self induced thermal heat rise of piezoelectric and electrostrictive stack actuators under AC dynamic operation motivated the research presented in this paper. First, an equation for the electrical admittance of an stack actuator that explicitly includes the effects of having the stack actuator in a host structure is provided. This equation is then shown to be critical when determining the apparent, reactive and dissipative power used by an actuator. With the theoretical predictions of the electrical admittance available, it is possible to calculate the contributions of the individual loss components to the total dissipative power. Using a simple heat transfer analysis, the internal heat rise of the actuator is predicted given the dissipative power input. A case study is used to illustrate how to apply the developed theories. This research provides a first step toward the ability to predict the temperature state of active materials in stack configurations. This would allow accurate prediction of actuator parameters and hence electro-dynamic behavior. Additionally, knowledge of the physics behind self induced heat rise can be used to avoid exceeding the active materials Curie temperature during operation and allow proper design of active isolation elements for temperature sensitive equipment.

Paper Details

Date Published: 8 May 1995
PDF: 12 pages
Proc. SPIE 2443, Smart Structures and Materials 1995: Smart Structures and Integrated Systems, (8 May 1995); doi: 10.1117/12.208279
Show Author Affiliations
Eric M. Flint, DLR-Institute for Structural Mechanics (United States)
Chen Liang, San Diego State Univ. (United States)
Craig A. Rogers, Virginia Polytechnic Institute and State Univ. (United States)

Published in SPIE Proceedings Vol. 2443:
Smart Structures and Materials 1995: Smart Structures and Integrated Systems
Inderjit Chopra, Editor(s)

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