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Proceedings Paper

Three-dimensional gas temperature measurements by computed tomography with incident angle variable interferometer
Author(s): Satoshi Tomioka; Shusuke Nishiyama; Samia Heshmat; Yasuhiro Hashimoto; Kodai Kurita
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Paper Abstract

This paper presents a method to measure three-dimensional gas temperature distribution without inserting a probe into the gas using techniques of computed tomography and optical interferometry. The temperature distribution can be reconstructed from a set of two-dimensional optical difference images for which the incident angle of each distribution differs. The each optical difference is measured by an interferometer with four mirrors which are movable and rotatable to control the incident angle. The temperature measurement system has two kinds of errors. The first is the error in the reconstruction caused by the limited angle of projection; the direction of the incident angle is limited in a certain region because of the limited arrangements of mirrors. The second is the errors in an evaluation of the projection data which is the two-dimensional optical difference distribution, which are included in steps to evaluate the optical difference; a carrier frequency detection of background fringe, a carrier component filtering, phase unwrapping, and so on. This paper shows improvements of accuracy of the reconstruction by adding a certain projection data to the original data set, and also the improvements of the evaluation of the optical difference by using newly developed algorithms to evaluate the optical differences.

Paper Details

Date Published: 12 March 2015
PDF: 10 pages
Proc. SPIE 9401, Computational Imaging XIII, 94010J (12 March 2015); doi: 10.1117/12.2082499
Show Author Affiliations
Satoshi Tomioka, Hokkaido Univ. (Japan)
Shusuke Nishiyama, Hokkaido Univ. (Japan)
Samia Heshmat, Hokkaido Univ. (Japan)
Yasuhiro Hashimoto, Hokkaido Univ. (Japan)
Kodai Kurita, Hokkaido Univ. (Japan)

Published in SPIE Proceedings Vol. 9401:
Computational Imaging XIII
Charles A. Bouman; Ken D. Sauer, Editor(s)

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