Share Email Print

Proceedings Paper

Capability enhancement in compact digital holographic microscopy
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A compact reflection digital holographic microscopy (DHM) system integrated with the light source and optical interferometer is developed for 3D topographic characterization and real-time dynamic inspection for Microelectromechanical systems (MEMS). Capability enhancement methods in lateral resolution, axial resolving range and large field of view for the compact DHM system are presented. To enhance the lateral resolution, the numerical aperture of a reflection DHM system is analyzed and optimum designed. To enhance the axial resolving range, dual wavelengths are used to extend the measuring range. To enable the large field of view, stitching of the measurement results is developed in the user-friendly software. Results from surfaces structures on silicon wafer, micro-optics on fused silica and dynamic inspection of MEMS structures demonstrate applications of this compact reflection digital holographic microscope for technical inspection in material science.

Paper Details

Date Published: 4 March 2015
PDF: 8 pages
Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93020I (4 March 2015); doi: 10.1117/12.2081128
Show Author Affiliations
Weijuan Qu, Ngee Ann Polytechnic (Singapore)
Yongfu Wen, Ngee Ann Polytechnic (Singapore)
Zhaomin Wang, Ngee Ann Polytechnic (Singapore)
Fang Yang, Ngee Ann Polytechnic (Singapore)
Anand Asundi, Nanyang Technological Univ. (Singapore)

Published in SPIE Proceedings Vol. 9302:
International Conference on Experimental Mechanics 2014
Chenggen Quan; Kemao Qian; Anand Asundi; Fook Siong Chau, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?