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Proceedings Paper

Optimization of energy window and evaluation of scatter compensation methods in MPS using the ideal observer with model mismatch
Author(s): Michael Ghaly; Jonathan M. Links; Eric Frey
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Paper Abstract

In this work, we used the ideal observer (IO) and IO with model mismatch (IO-MM) applied in the projection domain and an anthropomorphic Channelized Hotelling Observer (CHO) applied to reconstructed images to optimize the acquisition energy window width and evaluate various scatter compensation methods in the context of a myocardial perfusion SPECT defect detection task. The IO has perfect knowledge of the image formation process and thus reflects performance with perfect compensation for image-degrading factors. Thus, using the IO to optimize imaging systems could lead to suboptimal parameters compared to those optimized for humans interpreting SPECT images reconstructed with imperfect or no compensation. The IO-MM allows incorporating imperfect system models into the IO optimization process. We found that with near-perfect scatter compensation, the optimal energy window for the IO and CHO were similar; in its absence the IO-MM gave a better prediction of the optimal energy window for the CHO using different scatter compensation methods. These data suggest that the IO-MM may be useful for projection-domain optimization when model mismatch is significant, and that the IO is useful when followed by reconstruction with good models of the image formation process.

Paper Details

Date Published: 17 March 2015
PDF: 18 pages
Proc. SPIE 9416, Medical Imaging 2015: Image Perception, Observer Performance, and Technology Assessment, 94160N (17 March 2015); doi: 10.1117/12.2081043
Show Author Affiliations
Michael Ghaly, Johns Hopkins Univ. (United States)
Jonathan M. Links, Johns Hopkins Univ. (United States)
Eric Frey, Johns Hopkins Univ. (United States)

Published in SPIE Proceedings Vol. 9416:
Medical Imaging 2015: Image Perception, Observer Performance, and Technology Assessment
Claudia R. Mello-Thoms; Matthew A. Kupinski, Editor(s)

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