
Proceedings Paper
Rapid production of structural color images with optical data storage capabilitiesFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, we present novel methods to produce structural color image for any given color picture using a pixelated generic stamp named nanosubstrate. The nanosubstrate is composed of prefabricated arrays of red, green and blue subpixels. Each subpixel has nano-gratings and/or sub-wavelength structures which give structural colors through light diffraction. Micro-patterning techniques were implemented to produce the color images from the nanosubstrate by selective activation of subpixels. The nano-grating structures can be nanohole arrays, which after replication are converted to nanopillar arrays or vice versa. It has been demonstrated that visible and invisible data can be easily stored using these fabrication methods and the information can be easily read. Therefore the techniques can be employed to produce personalized and customized color images for applications in optical document security and publicity, and can also be complemented by combined optical data storage capabilities.
Paper Details
Date Published: 13 March 2015
PDF: 9 pages
Proc. SPIE 9374, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII, 93740O (13 March 2015); doi: 10.1117/12.2080719
Published in SPIE Proceedings Vol. 9374:
Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII
Georg von Freymann; Winston V. Schoenfeld; Raymond C. Rumpf; Henry Helvajian, Editor(s)
PDF: 9 pages
Proc. SPIE 9374, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII, 93740O (13 March 2015); doi: 10.1117/12.2080719
Show Author Affiliations
Mohamad Rezaei, Simon Fraser Univ. (Canada)
Hao Jiang, Simon Fraser Univ. (Canada)
Reza Qarehbaghi, Simon Fraser Univ. (Canada)
Hao Jiang, Simon Fraser Univ. (Canada)
Reza Qarehbaghi, Simon Fraser Univ. (Canada)
Published in SPIE Proceedings Vol. 9374:
Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII
Georg von Freymann; Winston V. Schoenfeld; Raymond C. Rumpf; Henry Helvajian, Editor(s)
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