Share Email Print

Proceedings Paper

Reliability study of high-brightness multiple single emitter diode lasers
Author(s): Jing Zhu; Thomas Yang; Cuipeng Zhang; Chao Lang; Xiaochen Jiang; Rui Liu; Yanyan Gao; Weirong Guo; Yuhua Jiang; Yang Liu; Luyan Zhang; Louisa Chen
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this study,the chip bonding processes for various chips from various chip suppliers around the world have been optimized to achieve reliable chip on sub-mount for high performance. These chip on sub-mounts, for examples, includes three types of bonding, 8xx nm-1.2W/10.0W Indium bonded lasers, 9xx nm 10W-20W AuSn bonded lasers and 1470 nm 6W Indium bonded lasers will be reported below. The MTTF@25℃ of 9xx nm chip on sub-mount (COS) is calculated to be more than 203,896 hours. These chips from various chip suppliers are packaged into many multiple single emitter laser modules, using similar packaging techniques from 2 emitters per module to up to 7 emitters per module. A reliability study including aging test is performed on those multiple single emitter laser modules. With research team’s 12 years’ experienced packaging design and techniques, precise optical and fiber alignment processes and superior chip bonding capability, we have achieved a total MTTF exceeding 177,710 hours of life time with 60% confidence level for those multiple single emitter laser modules. Furthermore, a separated reliability study on wavelength stabilized laser modules have shown this wavelength stabilized module packaging process is reliable as well.

Paper Details

Date Published: 13 March 2015
PDF: 12 pages
Proc. SPIE 9348, High-Power Diode Laser Technology and Applications XIII, 93480J (13 March 2015); doi: 10.1117/12.2080434
Show Author Affiliations
Jing Zhu, BWT Beijing Ltd. (China)
Thomas Yang, BWT Beijing Ltd. (China)
Cuipeng Zhang, BWT Beijing Ltd. (China)
Chao Lang, BWT Beijing Ltd. (China)
Xiaochen Jiang, BWT Beijing Ltd. (China)
Rui Liu, BWT Beijing Ltd. (China)
Yanyan Gao, BWT Beijing Ltd. (China)
Weirong Guo, BWT Beijing Ltd. (China)
Yuhua Jiang, BWT Beijing Ltd. (China)
Yang Liu, BWT Beijing Ltd. (China)
Luyan Zhang, BWT Beijing Ltd. (China)
Louisa Chen, BWT Beijing Ltd. (China)

Published in SPIE Proceedings Vol. 9348:
High-Power Diode Laser Technology and Applications XIII
Mark S. Zediker, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?