
Proceedings Paper
Reliability study of high-brightness multiple single emitter diode lasersFormat | Member Price | Non-Member Price |
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Paper Abstract
In this study,the chip bonding processes for various chips from various chip suppliers around the world have been
optimized to achieve reliable chip on sub-mount for high performance. These chip on sub-mounts, for examples, includes
three types of bonding, 8xx nm-1.2W/10.0W Indium bonded lasers, 9xx nm 10W-20W AuSn bonded lasers and 1470 nm
6W Indium bonded lasers will be reported below. The MTTF@25℃ of 9xx nm chip on sub-mount (COS) is calculated
to be more than 203,896 hours. These chips from various chip suppliers are packaged into many multiple single emitter
laser modules, using similar packaging techniques from 2 emitters per module to up to 7 emitters per module. A
reliability study including aging test is performed on those multiple single emitter laser modules. With research team’s 12
years’ experienced packaging design and techniques, precise optical and fiber alignment processes and superior chip
bonding capability, we have achieved a total MTTF exceeding 177,710 hours of life time with 60% confidence level for
those multiple single emitter laser modules. Furthermore, a separated reliability study on wavelength stabilized laser
modules have shown this wavelength stabilized module packaging process is reliable as well.
Paper Details
Date Published: 13 March 2015
PDF: 12 pages
Proc. SPIE 9348, High-Power Diode Laser Technology and Applications XIII, 93480J (13 March 2015); doi: 10.1117/12.2080434
Published in SPIE Proceedings Vol. 9348:
High-Power Diode Laser Technology and Applications XIII
Mark S. Zediker, Editor(s)
PDF: 12 pages
Proc. SPIE 9348, High-Power Diode Laser Technology and Applications XIII, 93480J (13 March 2015); doi: 10.1117/12.2080434
Show Author Affiliations
Jing Zhu, BWT Beijing Ltd. (China)
Thomas Yang, BWT Beijing Ltd. (China)
Cuipeng Zhang, BWT Beijing Ltd. (China)
Chao Lang, BWT Beijing Ltd. (China)
Xiaochen Jiang, BWT Beijing Ltd. (China)
Rui Liu, BWT Beijing Ltd. (China)
Thomas Yang, BWT Beijing Ltd. (China)
Cuipeng Zhang, BWT Beijing Ltd. (China)
Chao Lang, BWT Beijing Ltd. (China)
Xiaochen Jiang, BWT Beijing Ltd. (China)
Rui Liu, BWT Beijing Ltd. (China)
Yanyan Gao, BWT Beijing Ltd. (China)
Weirong Guo, BWT Beijing Ltd. (China)
Yuhua Jiang, BWT Beijing Ltd. (China)
Yang Liu, BWT Beijing Ltd. (China)
Luyan Zhang, BWT Beijing Ltd. (China)
Louisa Chen, BWT Beijing Ltd. (China)
Weirong Guo, BWT Beijing Ltd. (China)
Yuhua Jiang, BWT Beijing Ltd. (China)
Yang Liu, BWT Beijing Ltd. (China)
Luyan Zhang, BWT Beijing Ltd. (China)
Louisa Chen, BWT Beijing Ltd. (China)
Published in SPIE Proceedings Vol. 9348:
High-Power Diode Laser Technology and Applications XIII
Mark S. Zediker, Editor(s)
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