
Proceedings Paper
Propagation characteristics of multilayered subwavelength gratings composed of metallic nanoparticlesFormat | Member Price | Non-Member Price |
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Paper Abstract
The absorption and reflection characteristics of multilayered nanoplasmonic gratings with sub wavelength sizes are analyzed in details by using an efficient finite element method. The multilayered structures are composed by several layers of nanoparticles of metals such as Silver, Gold and Aluminum embedded in dielectric such as amorphous silicon over a metallic substrate. The propagations characteristics for several geometrical configurations are obtained and a broadband reflection or absorption covering the near infrared wavelengths has been observed. The proposed nanoplasmonic structures have a great potential for applications in photovoltaic cells or polarizers by improving their reflection or absorption efficiency. Peaks of reflection or absorption larger than 80% were obtained and their performance over the near infrared can be improved by adequately tuning their geometrical parameters, the refractive index and thickness of the layers as well as the nanoparticles shape and size.
Paper Details
Date Published: 16 March 2015
PDF: 7 pages
Proc. SPIE 9357, Physics and Simulation of Optoelectronic Devices XXIII, 93570I (16 March 2015); doi: 10.1117/12.2080333
Published in SPIE Proceedings Vol. 9357:
Physics and Simulation of Optoelectronic Devices XXIII
Bernd Witzigmann; Marek Osiński; Fritz Henneberger; Yasuhiko Arakawa, Editor(s)
PDF: 7 pages
Proc. SPIE 9357, Physics and Simulation of Optoelectronic Devices XXIII, 93570I (16 March 2015); doi: 10.1117/12.2080333
Show Author Affiliations
Joaquim Júnior Isídio de Lima, Federal Univ. of Bahia (Brazil)
Juarez Caetano da Silva, Federal Institute of Bahia (Brazil)
Juarez Caetano da Silva, Federal Institute of Bahia (Brazil)
Vitaly Felix Rodriguez-Esquerre, Federal Univ. of Bahia (Brazil)
Published in SPIE Proceedings Vol. 9357:
Physics and Simulation of Optoelectronic Devices XXIII
Bernd Witzigmann; Marek Osiński; Fritz Henneberger; Yasuhiko Arakawa, Editor(s)
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