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Proceedings Paper • Open Access

In-situ measurements of nanoscale phenomena using diffraction phase microscopy
Author(s): Chris Edwards; Steven J. McKeown; Suk-Won Hwang; Paul J. Froeter; Xiuling Li; John A. Rogers; Gabriel Popescu; Lynford L. Goddard

Paper Abstract

In this work, we present recent results on several novel applications including optically monitoring the dissolution of biodegradable materials proposed for use in biological electronic implants, the self-assembly of microtubes during semiconductor etching, and the expansion and deformation of palladium structures for use in hydrogen sensing applications. The measurements are done using diffraction phase microscopy (DPM), a quantitative phase imaging (QPI) technique, which uses the phase of the imaging field to reconstruct a map of the sample’s surface. It combines off-axis and common-path geometries allowing for single-shot, high-speed dynamics with sub-nanometer noise levels.

Paper Details

Date Published: 11 March 2015
PDF: 8 pages
Proc. SPIE 9336, Quantitative Phase Imaging, 93361K (11 March 2015); doi: 10.1117/12.2080253
Show Author Affiliations
Chris Edwards, Univ. of Illinois at Urbana-Champaign (United States)
Steven J. McKeown, Univ. of Illinois at Urbana-Champaign (United States)
Suk-Won Hwang, Korea Univ. (Korea, Republic of)
Paul J. Froeter, Univ. of Illinois at Urbana-Champaign (United States)
Xiuling Li, Univ. of Illinois at Urbana-Champaign (United States)
John A. Rogers, Univ. of Illinois at Urbana-Champaign (United States)
Gabriel Popescu, Univ. of Illinois at Urbana-Champaign (United States)
Lynford L. Goddard, Univ. of Illinois at Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 9336:
Quantitative Phase Imaging
Gabriel Popescu; YongKeun Park, Editor(s)

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