Proceedings Paper
Anomalous transmission of Ag/ZnO nanocomposites prepared by a magnetron sputtering| Format | Member Price | Non-Member Price |
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Paper Abstract
Single layer and double layer thin ZnO films with Ag nano-clusters on top and between them are fabricated by magnetron sputtering with subsequent annealing procedures. Transmission spectra measurements of the Ag/ZnO nanocomposite shows that a disordering (yet controllable) annealing modification, leads to a high transmission in the near- to the mid-IR spectral regimes. The spectra also show oscillations in the visible wavelength regime due to the excitation of surface plasmons that propagate along the surface of the nano-cluster. The behavior reported here is of interest for future implementation of new sub-wavelength, nanoplasmonic devices.
Paper Details
Date Published: 13 March 2015
PDF: 8 pages
Proc. SPIE 9364, Oxide-based Materials and Devices VI, 936420 (13 March 2015); doi: 10.1117/12.2080002
Published in SPIE Proceedings Vol. 9364:
Oxide-based Materials and Devices VI
Ferechteh H. Teherani; David C. Look; David J. Rogers, Editor(s)
PDF: 8 pages
Proc. SPIE 9364, Oxide-based Materials and Devices VI, 936420 (13 March 2015); doi: 10.1117/12.2080002
Show Author Affiliations
Andrey A. Machnev, National Research Univ. of Electronic Technology (Russian Federation)
Alexei S. Shuliatjev, National Research Univ. of Electronic Technology (Russian Federation)
Andrey E. Mironov, Univ. of Illinois at Urbana-Champaign (United States)
Dmitry G. Gromov, National Research Univ. of Electronic Technology (Russian Federation)
Alexei S. Shuliatjev, National Research Univ. of Electronic Technology (Russian Federation)
Andrey E. Mironov, Univ. of Illinois at Urbana-Champaign (United States)
Dmitry G. Gromov, National Research Univ. of Electronic Technology (Russian Federation)
Vladimir Mitrokhin, Photochemistry Research Ctr. (Russian Federation)
Igor V. Mel'nikov, National Research Univ. of Electronic Technology (Russian Federation)
Univ. of Illinois at Urbana-Champaign (United States)
Joseph W. Haus, Univ. of Dayton (United States)
Igor V. Mel'nikov, National Research Univ. of Electronic Technology (Russian Federation)
Univ. of Illinois at Urbana-Champaign (United States)
Joseph W. Haus, Univ. of Dayton (United States)
Published in SPIE Proceedings Vol. 9364:
Oxide-based Materials and Devices VI
Ferechteh H. Teherani; David C. Look; David J. Rogers, Editor(s)
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