Proceedings Paper
X-ray and scanning electron microscope studies on electrodeposited ZnCdS semiconductor alloys| Format | Member Price | Non-Member Price |
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Paper Abstract
ZnCdS semiconductor alloy films have been electrodeposited on conducting substrates.
X-ray studies show polycrystalline nature exhibiting hexagonal structure
for the solid solution. The lattice parameter variation obeys Vegard's law. SEM
studies show decreasing grain size with increasing zinc content. Heat treated films
show increased grain size thereby reducing grain boundary impurities. This lowers
the resistivity of the deposited films.
Paper Details
Date Published: 1 October 1990
PDF: 7 pages
Proc. SPIE 1284, Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors, (1 October 1990); doi: 10.1117/12.20798
Published in SPIE Proceedings Vol. 1284:
Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors
Harold G. Craighead; J. Murray Gibson, Editor(s)
PDF: 7 pages
Proc. SPIE 1284, Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors, (1 October 1990); doi: 10.1117/12.20798
Show Author Affiliations
M. Jayachandran, Central Electrochemical Research Institute (India)
V. K. Venkatesan, Central Electrochemical Research Institute (India)
V. K. Venkatesan, Central Electrochemical Research Institute (India)
T. Mahalingam, Alagappa Univ. (India)
V. Vinni, Alagappa Univ. (India)
V. Vinni, Alagappa Univ. (India)
Published in SPIE Proceedings Vol. 1284:
Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors
Harold G. Craighead; J. Murray Gibson, Editor(s)
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