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Proceedings Paper

X-ray and scanning electron microscope studies on electrodeposited ZnCdS semiconductor alloys
Author(s): M. Jayachandran; V. K. Venkatesan; T. Mahalingam; V. Vinni
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Paper Abstract

ZnCdS semiconductor alloy films have been electrodeposited on conducting substrates. X-ray studies show polycrystalline nature exhibiting hexagonal structure for the solid solution. The lattice parameter variation obeys Vegard's law. SEM studies show decreasing grain size with increasing zinc content. Heat treated films show increased grain size thereby reducing grain boundary impurities. This lowers the resistivity of the deposited films.

Paper Details

Date Published: 1 October 1990
PDF: 7 pages
Proc. SPIE 1284, Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors, (1 October 1990); doi: 10.1117/12.20798
Show Author Affiliations
M. Jayachandran, Central Electrochemical Research Institute (India)
V. K. Venkatesan, Central Electrochemical Research Institute (India)
T. Mahalingam, Alagappa Univ. (India)
V. Vinni, Alagappa Univ. (India)

Published in SPIE Proceedings Vol. 1284:
Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors
Harold G. Craighead; J. Murray Gibson, Editor(s)

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