
Proceedings Paper
The relationship between polymer waveguide optical interconnection end facet roughness and the optical input and output coupling lossesFormat | Member Price | Non-Member Price |
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Paper Abstract
The RMS surface roughness of an optical polymer waveguide end facet cut by a milling router and measured by AFM is
investigated for a range of rotation speeds and translation speeds of the router. It was found that 1 flute (cutting edge)
routers gave significantly less rough surfaces than 2 or 3 flute routers. The best results were achieved for a 1 flute router
when the milling bit was inserted from the copper layer side of the board with a rotation speed of 15,000 rpm and a
translation speed of 0.25 m/min which minimized the waveguide core end facet RMS roughness to 183 ± 8 nm and gave
input optical coupling loss of 1.7 dB ± 0.5 dB and output optical coupling loss of 2.0 dB ± 0.7 dB. The relationship
between optical coupling loss at the input and output of the waveguides and waveguide end facet roughness is also
investigated in this paper. The ratio of RMS roughness to autocorrelation length of the roughness is shown to have a
quantified linear relationship with experimental measurements of optical insertion loss, input optical coupling loss and
output optical coupling loss. A new fabrication technique for cut waveguide end facet treatment has been proposed and
demonstrated which reduces the insertion loss by 2.60 dB ± 1.3 dB which is more than that achieved by the closest
available index matching fluid which gave 2.23 dB ± 1.2 dB and which is far more robust for use in commercial products.
Paper Details
Date Published: 20 April 2015
PDF: 9 pages
Proc. SPIE 9360, Organic Photonic Materials and Devices XVII, 93600O (20 April 2015); doi: 10.1117/12.2079571
Published in SPIE Proceedings Vol. 9360:
Organic Photonic Materials and Devices XVII
Christopher E. Tabor; François Kajzar; Toshikuni Kaino; Yasuhiro Koike, Editor(s)
PDF: 9 pages
Proc. SPIE 9360, Organic Photonic Materials and Devices XVII, 93600O (20 April 2015); doi: 10.1117/12.2079571
Show Author Affiliations
Hadi Baghsiahi, Univ. College London (United Kingdom)
Kai Wang, Seagate Technology LLC (United Kingdom)
Kai Wang, Seagate Technology LLC (United Kingdom)
Richard Pitwon, Seagate Technology LLC (United Kingdom)
David R. Selviah, Univ. College London (United Kingdom)
David R. Selviah, Univ. College London (United Kingdom)
Published in SPIE Proceedings Vol. 9360:
Organic Photonic Materials and Devices XVII
Christopher E. Tabor; François Kajzar; Toshikuni Kaino; Yasuhiro Koike, Editor(s)
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