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Proceedings Paper

A multi-wavelength (u.v. to visible) laser system for early detection of oral cancer
Author(s): S. P. Najda; P. Perlin; M. Leszczyński; T. J. Slight; W. Meredith; M. Schemmann; Harry Moseley; J. A. Woods; R. Valentine; S. Kalra; P. Mossey; E. Theaker; M. Macluskey; G. Mimnagh; W. Mimnagh
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Paper Abstract

A multi-wavelength (360nm – 440nm), real-time Photonic Cancer Detector (PCD) optical system based on GaN semiconductor laser technology is outlined. A proof of concept using blue laser technology for early detection of cancer has already been tested and proven for esophageal cancer. This concept is expanded to consider a wider range of wavelengths and the PCD will initially be used for early diagnosis of oral cancers. The PCD creates an image of the oral cavity (broad field white light detection) and maps within the oral cavity any suspicious lesions with high sensitivity using a narrow field tunable detector.

Paper Details

Date Published: 2 March 2015
PDF: 6 pages
Proc. SPIE 9328, Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues XIII, 932809 (2 March 2015); doi: 10.1117/12.2079299
Show Author Affiliations
S. P. Najda, TopGaN Ltd. (Poland)
P. Perlin, TopGaN Ltd. (Poland)
M. Leszczyński, TopGaN Ltd. (Poland)
T. J. Slight, Compound Semiconductor Technologies Global Ltd. (United Kingdom)
W. Meredith, Compound Semiconductor Technologies Global Ltd. (United Kingdom)
M. Schemmann, FOCE International Technology (Netherlands)
Harry Moseley, Univ. of Dundee (United Kingdom)
J. A. Woods, Univ. of Dundee (United Kingdom)
R. Valentine, Univ. of Dundee (United Kingdom)
S. Kalra, Univ. of Dundee (United Kingdom)
P. Mossey, Univ. of Dundee (United Kingdom)
E. Theaker, Univ. of Dundee (United Kingdom)
M. Macluskey, Univ. of Dundee (United Kingdom)
G. Mimnagh, 2M Engineering Ltd. (Netherlands)
W. Mimnagh, 2M Engineering Ltd. (Netherlands)

Published in SPIE Proceedings Vol. 9328:
Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues XIII
Daniel L. Farkas; Dan V. Nicolau; Robert C. Leif, Editor(s)

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