
Proceedings Paper
Surface plasmon resonance (SPR) sensor using 2ω harmonic lock-in detectionFormat | Member Price | Non-Member Price |
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Paper Abstract
Surface plasmon resonance (SPR) sensor has been studied for high sensitivity optical biosensor as a single molecule
detection, virus detection, DNA sequencing etc. SPR sensor requires an ultra-small signal detection system that measures
very small intensity variation of reflected light along with the change of a refractive index near the sensor surface. In this
reason, lock-in detection method which is able to detect small signal buried in noise has been applied to SPR sensor. In
general lock-in detection method using multiplier and low pass filter measures DC value of output, and its sensitivity is
determined by 1/f noise at DC. Unlike the DC measurement we have proposed 2ω harmonic lock-in detection method
using multiplier and band pass filter. Sensitivity of the proposed lock-in detection method is much lower than 1/f noise at
DC. In this paper we will show that 2ω harmonic lock-in detection method for SPR sensor system providing the
sensitivity enhanced.
Paper Details
Date Published: 13 March 2015
PDF: 6 pages
Proc. SPIE 9369, Photonic Instrumentation Engineering II, 93690C (13 March 2015); doi: 10.1117/12.2079043
Published in SPIE Proceedings Vol. 9369:
Photonic Instrumentation Engineering II
Yakov G. Soskind; Craig Olson, Editor(s)
PDF: 6 pages
Proc. SPIE 9369, Photonic Instrumentation Engineering II, 93690C (13 March 2015); doi: 10.1117/12.2079043
Show Author Affiliations
Chang-In Park, Chung-Ang Univ. (Korea, Republic of)
Kwang-Jin Kim, Chung-Ang Univ. (Korea, Republic of)
Chang-gun Kim, Chung-Ang Univ. (Korea, Republic of)
Kwang-Jin Kim, Chung-Ang Univ. (Korea, Republic of)
Chang-gun Kim, Chung-Ang Univ. (Korea, Republic of)
Nam-Pyo Hong, Chung-Ang Univ. (Korea, Republic of)
Young-Wan Choi, Chung-Ang Univ. (Korea, Republic of)
Young-Wan Choi, Chung-Ang Univ. (Korea, Republic of)
Published in SPIE Proceedings Vol. 9369:
Photonic Instrumentation Engineering II
Yakov G. Soskind; Craig Olson, Editor(s)
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