Share Email Print

Proceedings Paper

Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift
Author(s): Mohammad Reza Jafarfard; Behnam Tayebi; Razie Jalali Nasab; Dug Young Kim
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We present a method to reduce the inherent errors caused by band-pass filter in off-axis quantitative phase microscopy and propose the optimum condition that can minimize these errors. We found that phase information of a sample in frequency domain nonlinearly oscillates as a function of the phase-shift correspond to the sample and its medium and the phase information of a sample inside the band-pass filter can be maximized by a proper phase-shift. Through numerical simulations and actual experiments, we demonstrate that the error in phase volume measurement can be effectively reduced by the enhancement of phase signal inside band-pass region using an optimum amount of phase that can be controlled by either changing medium index or wavelength of illumination.

Paper Details

Date Published: 10 March 2015
PDF: 11 pages
Proc. SPIE 9386, Practical Holography XXIX: Materials and Applications, 93860P (10 March 2015); doi: 10.1117/12.2078681
Show Author Affiliations
Mohammad Reza Jafarfard, Yonsei Univ. (Korea, Republic of)
Behnam Tayebi, Yonsei Univ. (Korea, Republic of)
Razie Jalali Nasab, Yonsei Univ. (Korea, Republic of)
Dug Young Kim, Yonsei Univ. (Korea, Republic of)

Published in SPIE Proceedings Vol. 9386:
Practical Holography XXIX: Materials and Applications
Hans I. Bjelkhagen; V. Michael Bove Jr., Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?