
Proceedings Paper
Modes analysis in random structures varying the disorder magnitudeFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Modal properties of disordered optical structures, including a 1D-like multilayer structure and a 2D planar slab, have been numerically simulated in the Mid-IR region. The amount of scattering and the disorder level have been varied. A Finite Element Method solver has been used to show the modal properties of these structures, highlighting the correlation between the spectral behavior and the amount of disorder. The quality factor has also been investigated. A statistical parameter, based on the definition of photons travel distance, has been proposed to give a measure of the disorder according to the modal properties. With the help of a Monte Carlo based software this parameter has been investigated to verify its suitability.
Paper Details
Date Published: 16 March 2015
PDF: 8 pages
Proc. SPIE 9357, Physics and Simulation of Optoelectronic Devices XXIII, 935713 (16 March 2015); doi: 10.1117/12.2078133
Published in SPIE Proceedings Vol. 9357:
Physics and Simulation of Optoelectronic Devices XXIII
Bernd Witzigmann; Marek Osiński; Fritz Henneberger; Yasuhiko Arakawa, Editor(s)
PDF: 8 pages
Proc. SPIE 9357, Physics and Simulation of Optoelectronic Devices XXIII, 935713 (16 March 2015); doi: 10.1117/12.2078133
Show Author Affiliations
Carlo Molardi, Singapore Institute of Manufacturing Technology (Singapore)
Univ. degli Studi di Parma (Italy)
Houkun Liang, Singapore Institute of Manufacturing Technology (Singapore)
Xia Yu, Singapore Institute of Manufacturing Technology (Singapore)
Univ. degli Studi di Parma (Italy)
Houkun Liang, Singapore Institute of Manufacturing Technology (Singapore)
Xia Yu, Singapore Institute of Manufacturing Technology (Singapore)
Ying Zhang, Singapore Institute of Manufacturing Technology (Singapore)
Annamaria Cucinotta, Univ. degli Studi di Parma (Italy)
Stefano Selleri, Univ. degli Studi di Parma (Italy)
Annamaria Cucinotta, Univ. degli Studi di Parma (Italy)
Stefano Selleri, Univ. degli Studi di Parma (Italy)
Published in SPIE Proceedings Vol. 9357:
Physics and Simulation of Optoelectronic Devices XXIII
Bernd Witzigmann; Marek Osiński; Fritz Henneberger; Yasuhiko Arakawa, Editor(s)
© SPIE. Terms of Use
