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Proceedings Paper

Automated determination of volume phase hologram parameters
Author(s): Robert D. Brown; James H. Stanley
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Paper Abstract

Commercially available ray tracing programs by themselves are not adequate for modelling optical systems with holographic gratings. In this paper, we describe a suite of tools that we have developed specifically for working with volume phase holograms. One tool measures the diffraction efficiency of a grating with respect to angle and position. Our automated measurement process is described. The measured diffraction data is analyzed to extract key grating parameters; such as, grating thickness and index modulation. The theoretical basis for this analysis is described. The extracted grating parameters can be used to ray trace expected performance for comparison with direct measurements. Such a methodology has allowed us to develop modelling capabilities that can be confidently used to compare design options and guide development activities. In our environment, data is collected and grating parameters are extracted using LabView; ray tracing is performed using Zemax. The concepts, however, are quite general. An example of measuring a grating recorded in a photopolymer and extracting its grating parameters is given. Results are compared to published datasheet specifications.

Paper Details

Date Published: 10 March 2015
PDF: 15 pages
Proc. SPIE 9386, Practical Holography XXIX: Materials and Applications, 93860I (10 March 2015); doi: 10.1117/12.2077841
Show Author Affiliations
Robert D. Brown, Rockwell Collins Inc. (United States)
James H. Stanley, Rockwell Collins Inc. (United States)

Published in SPIE Proceedings Vol. 9386:
Practical Holography XXIX: Materials and Applications
Hans I. Bjelkhagen; V. Michael Bove Jr., Editor(s)

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