
Proceedings Paper
A new method to achieve tens of nm axial super-localization based on conical diffraction PSF shapingFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
We present a method for Z-super-localization in fluorescence microscopy, based on conical diffraction. By using a thin biaxial crystal, the Point Spread Function (PSF) shape of an objective is made to depend strongly on the z coordinate. This z dependence is then exploited to localize fluorescent emitters axially with a great precision. We study how this method can be used for single molecule imaging with a global assessment by Fisher information analysis. Preliminary experiments demonstrate that this technique can obtain resolutions of tens of nm with the use of high NA objectives.
Paper Details
Date Published: 9 March 2015
PDF: 11 pages
Proc. SPIE 9331, Single Molecule Spectroscopy and Superresolution Imaging VIII, 93310Q (9 March 2015); doi: 10.1117/12.2077712
Published in SPIE Proceedings Vol. 9331:
Single Molecule Spectroscopy and Superresolution Imaging VIII
Jörg Enderlein; Ingo Gregor; Zygmunt Karol Gryczynski; Rainer Erdmann; Felix Koberling, Editor(s)
PDF: 11 pages
Proc. SPIE 9331, Single Molecule Spectroscopy and Superresolution Imaging VIII, 93310Q (9 March 2015); doi: 10.1117/12.2077712
Show Author Affiliations
Clément Fallet, Bioaxial SAS (France)
Maxime Dubois, Bioaxial SAS (France)
Jean-Yves Tinevez, Institut Pasteur Imagopole (France)
Stephane Oddos, Bioaxial SAS (France)
Maxime Dubois, Bioaxial SAS (France)
Jean-Yves Tinevez, Institut Pasteur Imagopole (France)
Stephane Oddos, Bioaxial SAS (France)
Julien Caron, Bioaxial SAS (France)
Roger Persson, Bioaxial SAS (France)
Spencer L. Shorte, Institut Pasteur Imagopole (France)
Gabriel Y. Sirat, Bioaxial SAS (France)
Roger Persson, Bioaxial SAS (France)
Spencer L. Shorte, Institut Pasteur Imagopole (France)
Gabriel Y. Sirat, Bioaxial SAS (France)
Published in SPIE Proceedings Vol. 9331:
Single Molecule Spectroscopy and Superresolution Imaging VIII
Jörg Enderlein; Ingo Gregor; Zygmunt Karol Gryczynski; Rainer Erdmann; Felix Koberling, Editor(s)
© SPIE. Terms of Use
