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Proceedings Paper

New generation of Fourier optics instruments for fast multispectral BRDF characterization
Author(s): Pierre Boher; Thierry Leroux; Véronique Collomb-Patton; Thibault Bignon
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Paper Abstract

A new generation of Fourier optics multispectral instruments that allow rapid full diffused or collimated beam spectral BRDF measurements is presented. Light detection is made simultaneously at all angular locations including the illumination direction. Backscattering effect in the fields of cosmetics and parasitic reflection of mobile displays are reported as examples.

Paper Details

Date Published: 13 March 2015
PDF: 12 pages
Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 93980H (13 March 2015); doi: 10.1117/12.2077600
Show Author Affiliations
Pierre Boher, ELDIM (France)
Thierry Leroux, ELDIM (France)
Véronique Collomb-Patton, ELDIM (France)
Thibault Bignon, ELDIM (France)

Published in SPIE Proceedings Vol. 9398:
Measuring, Modeling, and Reproducing Material Appearance 2015
Maria V. Ortiz Segovia; Philipp Urban; Francisco H. Imai, Editor(s)

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