Share Email Print
cover

Proceedings Paper

Vertical excitation profile in diffusion injected multi-quantum well light emitting diode structure
Author(s): L. Riuttanen; P. Kivisaari; O. Svensk; T. Vasara; P. Myllys; J. Oksanen; S. Suihkonen
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Due to their potential to improve the performance of light-emitting diodes (LEDs), novel device structures based on nanowires, surface plasmons, and large-area high-power devices have received increasing amount of interest. These structures are almost exclusively based on the double hetero junction (DHJ) structure, that has remained essentially unchanged for decades. In this work we study a III-nitride diffusion injected light-emitting diode (DILED), in which the active region is located outside the pn-junction and the excitation of the active region is based on bipolar diffusion of charge carriers. This unorthodox approach removes the need of placing the active region in the conventional current path and thus enabling carrier injection in device structures, which would be challenging to realize with the conventional DHJ design. The structure studied in this work is has 3 indium gallium nitride / gallium nitride (InGaN/GaN) quantum wells (QWs) under a GaN pn-junction. The QWs are grown at diferent growth temperatures for obtaining distinctive luminescence peaks. This allows to obtain knowledge on the carrier diffusion in the structure. When the device is biased, all QWs emit light indicating a significant diffusion current into the QW stack.

Paper Details

Date Published: 13 March 2015
PDF: 6 pages
Proc. SPIE 9363, Gallium Nitride Materials and Devices X, 93632A (13 March 2015); doi: 10.1117/12.2077549
Show Author Affiliations
L. Riuttanen, Aalto Univ. (Finland)
P. Kivisaari, Aalto Univ. (Finland)
O. Svensk, Aalto Univ. (Finland)
T. Vasara, Aalto Univ. (Finland)
P. Myllys, Aalto Univ. (Finland)
J. Oksanen, Aalto Univ. (Finland)
S. Suihkonen, Aalto Univ. (Finland)


Published in SPIE Proceedings Vol. 9363:
Gallium Nitride Materials and Devices X
Jen-Inn Chyi; Hiroshi Fujioka; Hadis Morkoç, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray