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Proceedings Paper

Spectrally resolved imaging of the transverse modes in multimode VCSELs
Author(s): Stephen M. Misak; Dan G. Dugmore; Kirsten A. Middleton; Evan R. Hale; Kelly R. Farner; Kent D. Choquette; Paul O. Leisher
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Paper Abstract

Vertical-cavity surface-emitting lasers (VCSELs) enable a range of applications such as data transmission, trace sensing, atomic clocks, and optical mice. For many of these applications, the output power and beam quality are both critical (i.e. high output power with good beam quality is desired). Multi-mode VCSELs offer much higher power than single-mode devices, but this comes at the expense of lower beam quality. Directly observing the resolved mode structure of multi-mode VCSELs would enable engineers to better understand the underlying physics and help them to develop multi-mode devices with improved beam quality. In this work, a low-cost, high-resolution (<3 pm) Echelle grating spectrometer system is used to map the two-dimensional VCSEL near-field emission profile. The system spectrally disperses the VCSEL beam and images it with high magnification onto a CMOS camera. The narrow spectral content of each LP mode allows direct observation of the modal content of the VCSEL.

Paper Details

Date Published: 4 March 2015
PDF: 7 pages
Proc. SPIE 9381, Vertical-Cavity Surface-Emitting Lasers XIX, 93810L (4 March 2015); doi: 10.1117/12.2076629
Show Author Affiliations
Stephen M. Misak, Rose-Hulman Institute of Technology (United States)
Dan G. Dugmore, Rose-Hulman Institute of Technology (United States)
Kirsten A. Middleton, Rose-Hulman Institute of Technology (United States)
Evan R. Hale, Rose-Hulman Institute of Technology (United States)
Kelly R. Farner, Rose-Hulman Institute of Technology (United States)
Kent D. Choquette, Univ. of Illinois at Urbana-Champaign (United States)
Paul O. Leisher, Rose-Hulman Institute of Technology (United States)

Published in SPIE Proceedings Vol. 9381:
Vertical-Cavity Surface-Emitting Lasers XIX
Chun Lei; Kent D. Choquette, Editor(s)

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