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Proceedings Paper

An image-based multi-directional reflectance measurement setup for flexible objects
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Paper Abstract

This paper presents an image-based method to measure reflectance of a homogeneous flexible object material (usually used in packaging). A point light source and a commercially available RGB camera is used to illuminate and measure the radiance reflected from the object surface in multiple reflection directions. By curving the flexible object onto a cylinder of known radius we are able to record radiance at multiple reflection angles in a faster way. In order to estimate the reflectance and to characterise the material, a spectralon reference tile is used. The spectralon tile is assumed to be homogenous and has near lambertain surface properties. Using Lambert’s cosine law, irradiance at a given point on the object surface is calculated. This information is then used to calculate a BRDF using Phong reflection model to describe the sample surface reflection properties. The measurement setup is described and discussed in this paper along with its use to estimate a BRDF for a given material/substrate. Results obtained indicate that the proposed image-based technique works well to measure light reflected at different planar angles and record information to estimate the BRDF of the sample materials that can be modelled using Phong reflection model. The object material properties, sample curvature and camera resolution decides the number of incident and reflection angles at which the bi-directional reflectance, or the material BRDF, can be estimated using this method.

Paper Details

Date Published: 13 March 2015
PDF: 11 pages
Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 93980J (13 March 2015); doi: 10.1117/12.2076592
Show Author Affiliations
Aditya S. Sole, Gjøvik Univ. College (Norway)
Ivar Farup, Gjøvik Univ. College (Norway)
Shoji Tominaga, Chiba Univ. (Japan)

Published in SPIE Proceedings Vol. 9398:
Measuring, Modeling, and Reproducing Material Appearance 2015
Maria V. Ortiz Segovia; Philipp Urban; Francisco H. Imai, Editor(s)

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