Proceedings Paper
Characterization of far field of diode laser by three dimensional measurement| Format | Member Price | Non-Member Price |
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Paper Abstract
In this paper three dimensional characterization of the far field of diode laser beam is proposed. Both the divergence angle and intensity distribution can be extracted and analyzed from the measurement results with obliquity factor correction and power transmission correction. The instrument provides high resolution and fast measurement.
Paper Details
Date Published: 26 February 2015
PDF
Proc. SPIE 9346, Components and Packaging for Laser Systems, 93461A (26 February 2015); doi: 10.1117/12.2076548
Published in SPIE Proceedings Vol. 9346:
Components and Packaging for Laser Systems
Alexei L. Glebov; Paul O. Leisher, Editor(s)
Proc. SPIE 9346, Components and Packaging for Laser Systems, 93461A (26 February 2015); doi: 10.1117/12.2076548
Show Author Affiliations
Hui Liu, Focuslight Technologies Co., Ltd. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Zhiyuan Yuan, Focuslight Technologies Co., Ltd. (China)
Long Cui, Focuslight Technologies Co., Ltd. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Zhiyuan Yuan, Focuslight Technologies Co., Ltd. (China)
Long Cui, Focuslight Technologies Co., Ltd. (China)
Di Wu, Focuslight Technologies Co., Ltd. (China)
Xingsheng Liu, Focuslight Technologies Co., Ltd. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Xingsheng Liu, Focuslight Technologies Co., Ltd. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Published in SPIE Proceedings Vol. 9346:
Components and Packaging for Laser Systems
Alexei L. Glebov; Paul O. Leisher, Editor(s)
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