Share Email Print

Proceedings Paper

Long wave infrared 3D scanner
Author(s): Ernst Wiedenmann; Mohsen Afrough; Sven Albert; Robert Schott; Jan Tusch; Andreas Wolf
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In industrial metrology, the system of fringe projection for the fast determination of 3D surface data has been established. The combination of areal and structured projection with two-dimensional optical sensors and triangulation measurement principle allows very high measurement point densities with reasonable accuracy. There are great difficulties with high gloss surfaces and with very dark surfaces for state of the art systems. Transparent materials cannot be measured using the visible spectrum of light. We have therefore developed a new structured light projection system that solves these problems. For the first time the physical principle of energy conversion is utilized in areal structured light projection. We are presenting first results to show the advantages and the capability of this new measurement principle.

Paper Details

Date Published: 19 May 2015
PDF: 11 pages
Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 94890G (19 May 2015);
Show Author Affiliations
Ernst Wiedenmann, Aimess Services GmbH (Germany)
Mohsen Afrough, Aimess Services GmbH (Germany)
Sven Albert, Aimess Services GmbH (Germany)
Robert Schott, Aimess Services GmbH (Germany)
Jan Tusch, Aimess Services GmbH (Germany)
Andreas Wolf, Aimess Services GmbH (Germany)

Published in SPIE Proceedings Vol. 9489:
Dimensional Optical Metrology and Inspection for Practical Applications IV
Kevin G. Harding; Toru Yoshizawa, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?