Proceedings Paper
Estimating the complex index of refraction based on the rough surface polarization degree| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
The complex index of refraction was the fixed characteristic of the target material. In the remote sense field, the complex index of the refraction is a useful parameter for classify and recognize the material. To detect the complex index of the refraction of the opaque material was difficult. A new method of estimating the complex refraction index based on the measured polarization degree of the material according to the different incident angle of reflectance angle was provided. The result showed that the stability and reliability of the acquired complex refraction index was fine.
Paper Details
Date Published: 19 February 2015
PDF: 5 pages
Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 94491E (19 February 2015); doi: 10.1117/12.2076028
Published in SPIE Proceedings Vol. 9449:
The International Conference on Photonics and Optical Engineering (icPOE 2014)
Ailing Tian; Anand Asundi; Weiguo Liu; Chunmin Zhang, Editor(s)
PDF: 5 pages
Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 94491E (19 February 2015); doi: 10.1117/12.2076028
Show Author Affiliations
Di Yang, Beijing Institute of Tracking and Telecommunication Technology (China)
Yonghong Zhan, Beijing Institute of Tracking and Telecommunication Technology (China)
Yonghong Zhan, Beijing Institute of Tracking and Telecommunication Technology (China)
Change Zeng, Beijing Institute of Tracking and Telecommunication Technology (China)
Published in SPIE Proceedings Vol. 9449:
The International Conference on Photonics and Optical Engineering (icPOE 2014)
Ailing Tian; Anand Asundi; Weiguo Liu; Chunmin Zhang, Editor(s)
© SPIE. Terms of Use
