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Proceedings Paper

Fast small target tracking in IR imagery based on improved similarity measure
Author(s): Qingyu Hou; Xiyang Zhi; Lihong Lu; Huili Zhang; Wei Zhang
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Paper Abstract

In order to enhance the robustness of IR fast small target tracking, a novel mean shift tracking algorithm using improved similarity measure of is proposed. Firstly, problems of local background interfering in original mean shift algorithm for tracking fast motion small target is analyzed, and the reasons is located in the Bhattacharyya coefficient similarity measure expression for all gray weights of components are same, which cannot reflect the advantage contribution of the small target’s gray component in the process of measuring similarity, causing serious interference of the background in the tracking process, leaving the algorithm converging easily. Therefore, to solve this problem, the improvements Bhattacharyya coefficient similarity measure with the local background information fused is proposed. Then, shift vector is deduced in the framework of mean shift by regarding Bhattacharyya coefficients as the similarity measure.In shifting process, the robustness of the small target tracking is improved effectively according to target gray level of large membership degree with high shift weight, and vice versa with low shift weight, which the background interference is suppressed to some extent. In sake of verifying the performance of the proposed algorithm, the classical mean shift algorithm and the algorithm of this paper is used in the target tracking simulation experiment, as well as the infrared image sequences containing the small fast targets of uncooled infrared camera is used. Finally the experimental result indicates that the performance of tracking the small fast target in IR images is robust.

Paper Details

Date Published: 24 November 2014
PDF: 7 pages
Proc. SPIE 9301, International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition, 93012V (24 November 2014); doi: 10.1117/12.2073057
Show Author Affiliations
Qingyu Hou, Harbin Institute of Technology (China)
Xiyang Zhi, Harbin Institute of Technology (China)
Lihong Lu, Tianjin Polytechnic Univ. (China)
Huili Zhang, Harbin Institute of Technology (China)
Wei Zhang, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 9301:
International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition
Gaurav Sharma; Fugen Zhou; Jennifer Liu, Editor(s)

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