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Proceedings Paper

A high-reflective surface measurement method based on conoscopic holography technology
Author(s): Xu Cheng; ZhongWei Li; YuSheng Shi; HengShuang Zhao; Guomin Zhan
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Paper Abstract

Measuring high-reflective surfaces using optical method is always a big challenging problem. This paper presents a high-reflective surface measurement method based on conoscopic holography technology using a 4D motion platform equipped with a conoscopic holography optical probe. There are two key problems needed to solve before the automate scan of the complex shape surface: the coordinate calibration and the path planning. To improve the calibration efficiency and accuracy, the coordinate calibration is divided into two parts: the rough calibration and the accurate registration. The path planning consists of two aspects including: the path points generation and the path points verification. In addition, by scanning the objects having high-reflective surfaces, such as the metal blades, coins and other work-pieces, the efficiency of the measurement method has been verified.

Paper Details

Date Published: 13 November 2014
PDF: 7 pages
Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 927608 (13 November 2014);
Show Author Affiliations
Xu Cheng, Huazhong Univ. of Science and Technology (China)
ZhongWei Li, Huazhong Univ. of Science and Technology (China)
YuSheng Shi, Huazhong Univ. of Science and Technology (China)
HengShuang Zhao, Huazhong Univ. of Science and Technology (China)
Guomin Zhan, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9276:
Optical Metrology and Inspection for Industrial Applications III
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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