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Proceedings Paper

Novel accurate measurement technique for carrier lifetime in 1.5-um semiconductor laser
Author(s): Marina Meliga; Roberto Paoletti; Marco Bello; Luca Cicchelli; Ivo Montrosset
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Paper Abstract

We propose a new accurate method for differential carrier lifetime measurement, in which the laser under test biased below threshold is optically modulated. Experimental results are very reproducible and show very high signal/noise ratio. No additional technological process for the laser under test are required.

Paper Details

Date Published: 24 April 1995
PDF: 4 pages
Proc. SPIE 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices, (24 April 1995); doi: 10.1117/12.206929
Show Author Affiliations
Marina Meliga, CSELT SpA (Italy)
Roberto Paoletti, Politecnico di Torino (Italy)
Marco Bello, CSELT SpA (Italy)
Luca Cicchelli, Politecnico di Torino (Italy)
Ivo Montrosset, Politecnico di Torino (Italy)

Published in SPIE Proceedings Vol. 2397:
Optoelectronic Integrated Circuit Materials, Physics, and Devices
Manijeh Razeghi; Yoon-Soo Park; Gerald L. Witt, Editor(s)

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