
Proceedings Paper
Lunar surface spectral analysis and mixed spectral model validation for the 2.2–3.2 μm wavebandFormat | Member Price | Non-Member Price |
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Paper Abstract
In the field of lunar surface content analysis, spectral characteristics of the 2.2~3.2 μm waveband can provide a strong basis for analyzing and identifying specific compositions. For lunar soil, an object’s spectrum in this band includes not only reflective solar radiance, but also emissive radiance from the temperature characteristics of the object itself. These form a mixed spectrum, which complicates the spectral analysis for this band. Based on a mixed spectral model, considering both reflective and emissive radiance on the lunar surface, spectral characteristics for a 2.2~3.2 μm waveband are simulated and relationships are analyzed between reflective/emissive spectra and factors such as temperature, light, an object’s physical composition, etc. Moreover, a simulative platform (incorporating a spectrometer, light source, temperature controller, and simulative object) is developed according to lunar surface conditions, so as to further validate the mixed spectral model, which may provide a reference for lunar surface spectral analysis and the development of spectrometers.
Paper Details
Date Published: 18 November 2014
PDF: 8 pages
Proc. SPIE 9263, Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques and Applications V, 92632Q (18 November 2014); doi: 10.1117/12.2068791
Published in SPIE Proceedings Vol. 9263:
Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques and Applications V
Allen M. Larar; Makoto Suzuki; Jianyu Wang, Editor(s)
PDF: 8 pages
Proc. SPIE 9263, Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques and Applications V, 92632Q (18 November 2014); doi: 10.1117/12.2068791
Show Author Affiliations
Mi Tian, Shanghai Institute of Technical Physics (China)
Zhi-ping He, Shanghai Institute of Technical Physics (China)
Yan-hua Ma, Shanghai Institute of Technical Physics (China)
Zhi-ping He, Shanghai Institute of Technical Physics (China)
Yan-hua Ma, Shanghai Institute of Technical Physics (China)
Rui Xu, Shanghai Institute of Technical Physics (China)
Jian-yu Wang, Shanghai Institute of Technical Physics (China)
Jian-yu Wang, Shanghai Institute of Technical Physics (China)
Published in SPIE Proceedings Vol. 9263:
Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques and Applications V
Allen M. Larar; Makoto Suzuki; Jianyu Wang, Editor(s)
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