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Proceedings Paper

Technology for infrared sensors produced in low volume
Author(s): Raymond S. Balcerak
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Paper Abstract

Infrared sensors are generally considered a specialized product for military applications. With the reduction in the projected volume to be procured by the military, industry is actively pursuing new applications of IR sensors in security, surveillance, medical, and process control systems. With this expansion of the potential application base, rapid response to customer requirements and further cost reductions are essential to respond to the future marketplace. Initiatives to develop new detector and JR sensor technologies must maintain this new market perspective. This paper reviews market potential and describes technology initiatives necessary to produce a wide variety of JR sensors in low volume and at affordable cost. The initiatives address all aspects of the JR sensor module production, including the detector, packaging, cryogenics, and electronics. Since the sensor design is an integral part of the overall electro-optical system design, software tools linking sensor specifications to system requirements are also essential to the production of affordable sensors in small quantities. Utilization of this integrated sensor/system design trade space early in the design process provides the capability to make cost/performance tradeoffs that are useful in guiding the selection of detector configuration, packaging, and electronics. Integration of these design activities with factory process capabilities provides the potential for rapid production of new sensor designs at an affordable cost, even in low volume.

Paper Details

Date Published: 24 April 1995
PDF: 8 pages
Proc. SPIE 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices, (24 April 1995); doi: 10.1117/12.206867
Show Author Affiliations
Raymond S. Balcerak, ARPA (United States)

Published in SPIE Proceedings Vol. 2397:
Optoelectronic Integrated Circuit Materials, Physics, and Devices
Manijeh Razeghi; Yoon-Soo Park; Gerald L. Witt, Editor(s)

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