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Proceedings Paper

An assessment of TanDEM-X GlobalDEM over rural and urban areas
Author(s): Fifamè N. Koudogbo; Javier Duro; Martin Huber; Roberto Rudari; Andrew Eddy; Richard Lucas
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Paper Abstract

Digital Elevation Model (DEM) is a key input for the development of risk management systems. Main limitation of the current available DEM is the low level of resolution. DEMs such as STRM 90m or ASTER are globally available free of charge, but offer limited use, for example, to flood modelers in most geographic areas. TanDEM-X (TerraSAR-X add-on for Digital Elevation Measurement), the first bistatic SAR can fulfil this gap. The mission objective is the generation of a consistent global digital elevation model with an unprecedented accuracy according to the HRTI-3 (High Resolution Terrain Information) specifications. The mission opens a new era in risk assessment. In the framework of ALTAMIRA INFORMATION research activities, the DIAPASON (Differential Interferometric Automated Process Applied to Survey Of Nature) processing chain has been successfully adapted to TanDEM-X CoSSC (Coregistered Slant Range Single Look Complex) data processing. In this study the capability of CoSSC data for DEM generation is investigated. Within the on-going FP7 RASOR project (Rapid Analysis and Spatialisation and Of Risk), the generated DEM are compared with Intermediate DEM derived from the TanDEM-X first global coverage. The results are presented and discussed.

Paper Details

Date Published: 21 October 2014
PDF: 9 pages
Proc. SPIE 9243, SAR Image Analysis, Modeling, and Techniques XIV, 92430M (21 October 2014); doi: 10.1117/12.2067463
Show Author Affiliations
Fifamè N. Koudogbo, Altamira Information (Spain)
Javier Duro, Altamira Information (Spain)
Martin Huber, DLR, German Remote Sensing Data Ctr. (Germany)
Roberto Rudari, CIMA Foundation (Italy)
Andrew Eddy, Athena Global Europe (France)
Richard Lucas, The Univ. of New South Wales (Australia)

Published in SPIE Proceedings Vol. 9243:
SAR Image Analysis, Modeling, and Techniques XIV
Claudia Notarnicola; Simonetta Paloscia; Nazzareno Pierdicca, Editor(s)

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