
Proceedings Paper
Characterization of HAMR using pulsed laser lightFormat | Member Price | Non-Member Price |
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Paper Abstract
Pulsed Heat Assisted Magnetic Recording (HAMR) is being developed to improve HAMR reliability. In conventional
HAMR systems the laser is on and at a fixed power during the writing of the entire sector. In a pulsed HAMR
implementation, the laser is turned on and off during the bit cell. For example, for a 50% duty cycle, the laser is on for
half the bit cell and off for the remainder of the bit cell. Unlike traditional HAMR where the transitions are formed
when the magnetic writer switches, in a pulsed implementation the transitions are formed during the pulsing of the laser.
In this paper we show spin stand and drive recording performance of pulsed HAMR systems and compare the outcome
to conventional recording. In particular, we show the importance and sensitivity of having proper alignment between the
phase of the optical and magnetic signals and their effect on bit error rate (BER).
Paper Details
Date Published: 5 September 2014
PDF: 10 pages
Proc. SPIE 9201, Optical Data Storage 2014, 920108 (5 September 2014); doi: 10.1117/12.2066243
Published in SPIE Proceedings Vol. 9201:
Optical Data Storage 2014
Ryuichi Katayama; Thomas D. Milster, Editor(s)
PDF: 10 pages
Proc. SPIE 9201, Optical Data Storage 2014, 920108 (5 September 2014); doi: 10.1117/12.2066243
Show Author Affiliations
Kevin R. Heim, Seagate Technology LLC (United States)
Tim S. Rausch, Seagate Technology LLC (United States)
Alfredo S. Chu, Seagate Technology LLC (United States)
Tim S. Rausch, Seagate Technology LLC (United States)
Alfredo S. Chu, Seagate Technology LLC (United States)
Pu-Ling Lu, Seagate Technology LLC (United States)
John W. Dykes, Seagate Technology LLC (United States)
Edward C. Gage, Seagate Technology LLC (United States)
John W. Dykes, Seagate Technology LLC (United States)
Edward C. Gage, Seagate Technology LLC (United States)
Published in SPIE Proceedings Vol. 9201:
Optical Data Storage 2014
Ryuichi Katayama; Thomas D. Milster, Editor(s)
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