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Proceedings Paper

Nanoprobe electrical measurements of single nanowire structures (presentation video)
Author(s): Simon Watkins
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Paper Abstract

In-place measurement of semiconductor nanowires can be achieved using a nanoprobe inside a scanning electron microscope. Gold catalyzed vapour-liquid-solid nanowires exhibit a highly perfect metal semiconductor interface which is generally rectifying for moderate to low doping values. The electrical properties of the semiconducting region can be inferred from careful attention to the IV properties in a rapid measurement process involving no lithography or sidewall degradation. The technique is useful for evaluating the effect of surface states on the nanowire conductivity. We present initial results on the epitaxy and electrical characterization of core-shell p-n junction structures using the nanoprobe method.

Paper Details

Date Published: 17 August 2014
PDF: 1 pages
Proc. SPIE 9174, Nanoepitaxy: Materials and Devices VI, 917403 (17 August 2014); doi: 10.1117/12.2065265
Show Author Affiliations
Simon Watkins, Simon Fraser Univ. (Canada)

Published in SPIE Proceedings Vol. 9174:
Nanoepitaxy: Materials and Devices VI
Nobuhiko P. Kobayashi; A. Alec Talin; Albert V. Davydov; M. Saif Islam, Editor(s)

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