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Proceedings Paper

Femtosecond-scale x-ray FEL diagnostics with the LCLS X-band transverse deflector
Author(s): Timothy J. Maxwell; Christopher Behrens; Yuantao Ding; Zhirong Huang; Patrick Krejcik; Agostino Marinelli; Luciano Piccoli; Daniel Ratner
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Paper Abstract

Analysis of single-shot, lasing-induced changes of the longitudinal electron bunch properties has proven invaluable for fs-scale reconstruction of otherwise difficult to measure x-ray FEL pulse profiles. In this talk, we report on measurements following the recent installation of an X-band transverse deflecting mode cavity at the LCLS. Limitations of the FEL pulse profiling technique employed are discussed. An unprecedented 1 to 3 fs RMS time resolution of x-ray and electron bunch profiles is demonstrated. Phenomena impacting x-ray FEL performance are also observed. The new tool is proven as a powerful diagnostic in support of user experiments and machine improvement studies.

Paper Details

Date Published: 8 October 2014
PDF: 10 pages
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100J (8 October 2014); doi: 10.1117/12.2065252
Show Author Affiliations
Timothy J. Maxwell, SLAC National Accelerator Lab. (United States)
Christopher Behrens, Deutsches Elektronen-Synchrotron (Germany)
Yuantao Ding, SLAC National Accelerator Lab. (United States)
Zhirong Huang, SLAC National Accelerator Lab. (United States)
Patrick Krejcik, SLAC National Accelerator Lab. (United States)
Agostino Marinelli, SLAC National Accelerator Lab. (United States)
Luciano Piccoli, SLAC National Accelerator Lab. (United States)
Daniel Ratner, SLAC National Accelerator Lab. (United States)


Published in SPIE Proceedings Vol. 9210:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Stefan P. Hau-Riege; Stefan P. Moeller; Makina Yabashi, Editor(s)

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