Being a scanning microscopy, Stimulated Emission Depletion (STED) needs to be parallelized for fast wide-field imaging. Here, we achieve large parallelization of STED microscopy using well-designed Optical Lattice (OL) for depletion, together with a fast camera for detection. Depletion optical lattices with 100 intensity “zeros” are generated by four-beam interference. Scanning only a unit cell, as small as 290 nm by 290 nm, of the depletion OL is sufficient for STED imaging. The OL-STED microscopy acquires super-resolution images with 70 nm resolution and at the speed of 80 ms per image.

Date Published: 28 August 2014
PDF: 6 pages
Proc. SPIE 9169, Nanoimaging and Nanospectroscopy II, 91690E (28 August 2014); doi: 10.1117/12.2064820

Published in SPIE Proceedings Vol. 9169:
Nanoimaging and Nanospectroscopy II
Prabhat Verma; Alexander Egner, Editor(s)