
Proceedings Paper
The effect of dilution on the quantitative measurement of bubbles in high-density ultrafine bubble-filled water using the light scattering methodFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
We have developed an ultrafine bubble generating system, ultrafineGALF, upgrading the microGALF system to a flow rate of 0.24 m3/h. The ultrafineGALF system can generate a dense population of more than 109 ultrafine bubbles per ml. The density and size distribution of these bubbles have been measured using a NanoSight measuring instrument, but precision measurement of the number density has become difficult because it now extends beyond the measuring range (1×109/ml) of this instrument. Thus far, the number density of the ultrafine bubbles after dilution has been measured, but few reports are available on the effect of dilution on gas particles, which behave differently from solid particles. In this study, the effect of dilution, which is required to measure the density of ultrafine bubbles at ultra-high densities, was investigated. No large differences due to the use of dilution among three types of samples with different concentrations of ultrafine bubbles were found, although the samples did show slightly different rates of change in the concentration of ultrafine bubbles over time.
Paper Details
Date Published: 6 August 2014
PDF: 5 pages
Proc. SPIE 9232, International Conference on Optical Particle Characterization (OPC 2014), 92320V (6 August 2014); doi: 10.1117/12.2064810
Published in SPIE Proceedings Vol. 9232:
International Conference on Optical Particle Characterization (OPC 2014)
Nobuhiro Aya; Norihiko Iki; Tsutomu Shimura; Tomohiro Shirai, Editor(s)
PDF: 5 pages
Proc. SPIE 9232, International Conference on Optical Particle Characterization (OPC 2014), 92320V (6 August 2014); doi: 10.1117/12.2064810
Show Author Affiliations
Shigeo Maeda, IDEC Corp. (Japan)
Hideaki Kobayashi, IDEC Corp. (Japan)
Katsuhisa Ida, IDEC Corp. (Japan)
Hideaki Kobayashi, IDEC Corp. (Japan)
Katsuhisa Ida, IDEC Corp. (Japan)
Masakazu Kashiwa, IDEC Corp. (Japan)
Ikkan Nishihara, IDEC Corp. (Japan)
Toshihiro Fujita, IDEC Corp. (Japan)
Ikkan Nishihara, IDEC Corp. (Japan)
Toshihiro Fujita, IDEC Corp. (Japan)
Published in SPIE Proceedings Vol. 9232:
International Conference on Optical Particle Characterization (OPC 2014)
Nobuhiro Aya; Norihiko Iki; Tsutomu Shimura; Tomohiro Shirai, Editor(s)
© SPIE. Terms of Use
