
Proceedings Paper
Nanomanufacturing metrology for cellulosic nanomaterials: an updateFormat | Member Price | Non-Member Price |
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Paper Abstract
The development of the metrology and standards for advanced manufacturing of cellulosic nanomaterials (or
basically, wood-based nanotechnology) is imperative to the success of this rising economic sector. Wood-based
nanotechnology is a revolutionary technology that will create new jobs and strengthen America’s forest-based
economy through industrial development and expansion. It allows this, previously perceived, low-tech industry
to leap-frog directly into high-tech products and processes and thus improves its current economic slump. Recent
global investments in nanotechnology programs have led to a deeper appreciation of the high performance
nature of cellulose nanomaterials. Cellulose, manufactured to the smallest possible-size (~2 nm x ~100 nm),
is a high-value material that enables products to be lighter and stronger; have less embodied energy; utilize no
catalysts in the manufacturing, are biologically compatible and, come from a readily renewable resource. In addition
to the potential for a dramatic impact on the national economy - estimated to be as much as $250 billion
worldwide by 2020 - cellulose-based nanotechnology creates a pathway for expanded and new markets utilizing
these renewable materials. The installed capacity associated with the US pulp and paper industry represents
an opportunity, with investment, to rapidly move to large scale production of nano-based materials. However,
effective imaging, characterization and fundamental measurement science for process control and characterization
are lacking at the present time. This talk will discuss some of these needed measurements and potential
solutions.
Paper Details
Date Published: 27 August 2014
PDF: 9 pages
Proc. SPIE 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII, 917302 (27 August 2014); doi: 10.1117/12.2064023
Published in SPIE Proceedings Vol. 9173:
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Michael T. Postek, Editor(s)
PDF: 9 pages
Proc. SPIE 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII, 917302 (27 August 2014); doi: 10.1117/12.2064023
Show Author Affiliations
Michael T. Postek, National Institute of Standards and Technology (United States)
Published in SPIE Proceedings Vol. 9173:
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Michael T. Postek, Editor(s)
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