
Proceedings Paper
X-ray photoemission spectroscopy study of vertical phase separation in F8BT:PDI/ITO films for photovoltaic applicationsFormat | Member Price | Non-Member Price |
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Paper Abstract
We present a depth-resolved X-ray photoemission spectroscopy study of the Poly(9,9’-dioctylfluorene-cobenzothiadiazole):
Perylene tetracarboxylic diimide blend (briefly, F8BT:PDI), employed for the realization of the light
harvesting layer in organic photovoltaic devices. We address the problem of the vertical distribution of PDI molecules in
the blend, relevant for the optimization of the photo-generated charge collection in such devices. The depth resolution is
obtained by sputtering the organic layer with Ar+ ions. A thorough investigation of the effects of different sputtering
treatments on the F8BT:PDI film surface is presented. Changes in the stoichiometry of the organic layer, as well as the
cleavage of molecular bonds are detected, even after mild sputtering. In particular, we report about the formation of a
carbon-rich surface layer. Finally, a method is proposed for the calculation of the PDI concentration, which relies on the
detection of specific chemical markers and is robust against sputter-induced artifacts. As a case study, we evaluated the
PDI concentration in a 10 nm thick F8BT:PDI layer spin coated on indium tin oxide.
Paper Details
Date Published: 9 September 2014
PDF: 9 pages
Proc. SPIE 9165, Physical Chemistry of Interfaces and Nanomaterials XIII, 91650C (9 September 2014); doi: 10.1117/12.2063929
Published in SPIE Proceedings Vol. 9165:
Physical Chemistry of Interfaces and Nanomaterials XIII
Natalie Banerji; Sophia C. Hayes; Carlos Silva, Editor(s)
PDF: 9 pages
Proc. SPIE 9165, Physical Chemistry of Interfaces and Nanomaterials XIII, 91650C (9 September 2014); doi: 10.1117/12.2063929
Show Author Affiliations
A. Brambilla, Politecnico di Milano (Italy)
A. Calloni, Politecnico di Milano (Italy)
E. Aluicio-Sardui, Istituto Italiano di Tecnologia (Italy)
G. Berti, Politecnico di Milano (Italy)
Z. Kan, Istituto Italiano di Tecnologia (Italy)
S. Beaupré, Univ. Laval (Canada)
A. Calloni, Politecnico di Milano (Italy)
E. Aluicio-Sardui, Istituto Italiano di Tecnologia (Italy)
G. Berti, Politecnico di Milano (Italy)
Z. Kan, Istituto Italiano di Tecnologia (Italy)
S. Beaupré, Univ. Laval (Canada)
M. Leclerc, Univ. Laval (Canada)
H.-J. Butt, Max Planck Institute for Polymer Research (Germany)
G. Floudas, Univ. of Ioannina (Greece)
P. E. Keivanidis, Istituto Italiano di Tecnologia (Italy)
L. Duò, Politecnico di Milano (Italy)
H.-J. Butt, Max Planck Institute for Polymer Research (Germany)
G. Floudas, Univ. of Ioannina (Greece)
P. E. Keivanidis, Istituto Italiano di Tecnologia (Italy)
L. Duò, Politecnico di Milano (Italy)
Published in SPIE Proceedings Vol. 9165:
Physical Chemistry of Interfaces and Nanomaterials XIII
Natalie Banerji; Sophia C. Hayes; Carlos Silva, Editor(s)
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