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Proceedings Paper

Calculation of the instrumental profile function for a powder diffraction beamline used in nanocrystalline material research
Author(s): Luca Rebuffi; Paolo Scardi
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Paper Abstract

Ray-tracing algorithms are used to simulate the instrumental function of a synchrotron beamline targeted to the advanced characterization of nanocrystalline materials by powder diffraction. The characteristics of the source, a bending magnet in the present case of study, and the optics influence the instrumental profile, which is a key parameter for obtaining information on the nanostructure. We combine the SHADOW simulation with the calculation of powder diffraction profiles from standard materials, into a high-level workflow environment based on the ORANGE software, allowing us to integrate data analysis fitting software with realistic information.

Paper Details

Date Published: 17 September 2014
PDF: 12 pages
Proc. SPIE 9209, Advances in Computational Methods for X-Ray Optics III, 92090J (17 September 2014);
Show Author Affiliations
Luca Rebuffi, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)
Univ. degli Studi di Trento (Italy)
Paolo Scardi, Univ. degli Studi di Trento (Italy)


Published in SPIE Proceedings Vol. 9209:
Advances in Computational Methods for X-Ray Optics III
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)

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