Proceedings Paper
Calculation of the instrumental profile function for a powder diffraction beamline used in nanocrystalline material research| Format | Member Price | Non-Member Price |
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Paper Abstract
Ray-tracing algorithms are used to simulate the instrumental function of a synchrotron beamline targeted to the advanced
characterization of nanocrystalline materials by powder diffraction. The characteristics of the source, a bending magnet
in the present case of study, and the optics influence the instrumental profile, which is a key parameter for obtaining
information on the nanostructure.
We combine the SHADOW simulation with the calculation of powder diffraction profiles from standard materials, into a
high-level workflow environment based on the ORANGE software, allowing us to integrate data analysis fitting software
with realistic information.
Paper Details
Date Published: 17 September 2014
PDF: 12 pages
Proc. SPIE 9209, Advances in Computational Methods for X-Ray Optics III, 92090J (17 September 2014); doi: 10.1117/12.2063745
Published in SPIE Proceedings Vol. 9209:
Advances in Computational Methods for X-Ray Optics III
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)
PDF: 12 pages
Proc. SPIE 9209, Advances in Computational Methods for X-Ray Optics III, 92090J (17 September 2014); doi: 10.1117/12.2063745
Show Author Affiliations
Paolo Scardi, Univ. degli Studi di Trento (Italy)
Published in SPIE Proceedings Vol. 9209:
Advances in Computational Methods for X-Ray Optics III
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)
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