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Proceedings Paper

The inversion of inchoherent light scattering data to obtain statistical and optical properties of a two-dimensional randomly rough dielectric surface.
Author(s): S. Chakrabarti; A. A. Maradudin; I. Simonsen; E. I. Chaikina
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Paper Abstract

An approach to inverting experimental light scattering data for obtaining the normalized surface height autocorrelation function of a two-dimensional randomly rough dielectric surface, and its rms height is presented. It is based on the expression for the contribution to the mean differential reflection coefficient from the in-plane, co-polarized, light of s-polarization scattered diffusely from such a surface, obtained by phase perturbation theory. For weakly rough surfaces the reconstructions obtained by this approach are quite accurate.

Paper Details

Date Published: 5 September 2014
PDF: 7 pages
Proc. SPIE 9205, Reflection, Scattering, and Diffraction from Surfaces IV, 920505 (5 September 2014); doi: 10.1117/12.2063608
Show Author Affiliations
S. Chakrabarti, Univ. of California, Irvine (United States)
A. A. Maradudin, Univ. of California, Irvine (United States)
I. Simonsen, Norwegian Univ. of Science and Technology (Norway)
E. I. Chaikina, Ctr. de Investigación Científica y de Educación Superior de Ensenada B.C. (Mexico)


Published in SPIE Proceedings Vol. 9205:
Reflection, Scattering, and Diffraction from Surfaces IV
Leonard M. Hanssen, Editor(s)

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