
Proceedings Paper
Microscopic type of real-time uniaxial 3D profilometry by polarization cameraFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper introduces a novel polarization structured light pattern projector was done by taking into account the
unique characteristic of the pixelated camera and a spatial light modulator (SLM) used. Height variations of reflective
samples are retrieved by using fringe contrast modulation on an uniaxial configuration. By placing a special retardance
pattern on the SLM, the pixelated camera will detect a phase shifted sinusoidal pattern where later its contrast change
will be used to retrieve the height information of the sample under study. The presented system takes into account the
defocus change obtained by the height variation of the sample by encoding the information on the fringe contrast of the
projected structured light pattern by the SLM. The final purpose of this work is to present a single shot 3D profilometry
system based in fringe contrast analysis. Experimental results of a moving glass slide are presented.
Paper Details
Date Published: 18 August 2014
PDF: 6 pages
Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 920311 (18 August 2014); doi: 10.1117/12.2063439
Published in SPIE Proceedings Vol. 9203:
Interferometry XVII: Techniques and Analysis
Katherine Creath; Jan Burke; Joanna Schmit, Editor(s)
PDF: 6 pages
Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 920311 (18 August 2014); doi: 10.1117/12.2063439
Show Author Affiliations
Shuhei Shibata, Utsunomiya Univ. (Japan)
Fumio Kobayashi, Utsunomiya Univ. (Japan)
Fumio Kobayashi, Utsunomiya Univ. (Japan)
Published in SPIE Proceedings Vol. 9203:
Interferometry XVII: Techniques and Analysis
Katherine Creath; Jan Burke; Joanna Schmit, Editor(s)
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