Share Email Print

Proceedings Paper

Microscopic type of real-time uniaxial 3D profilometry by polarization camera
Author(s): Shuhei Shibata; Fumio Kobayashi; Daisuke Barada; Yukitoshi Otani
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper introduces a novel polarization structured light pattern projector was done by taking into account the unique characteristic of the pixelated camera and a spatial light modulator (SLM) used. Height variations of reflective samples are retrieved by using fringe contrast modulation on an uniaxial configuration. By placing a special retardance pattern on the SLM, the pixelated camera will detect a phase shifted sinusoidal pattern where later its contrast change will be used to retrieve the height information of the sample under study. The presented system takes into account the defocus change obtained by the height variation of the sample by encoding the information on the fringe contrast of the projected structured light pattern by the SLM. The final purpose of this work is to present a single shot 3D profilometry system based in fringe contrast analysis. Experimental results of a moving glass slide are presented.

Paper Details

Date Published: 18 August 2014
PDF: 6 pages
Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 920311 (18 August 2014); doi: 10.1117/12.2063439
Show Author Affiliations
Shuhei Shibata, Utsunomiya Univ. (Japan)
Fumio Kobayashi, Utsunomiya Univ. (Japan)
Daisuke Barada, Utsunomiya Univ. (Japan)
Yukitoshi Otani, Utsunomiya Univ. (Japan)

Published in SPIE Proceedings Vol. 9203:
Interferometry XVII: Techniques and Analysis
Katherine Creath; Jan Burke; Joanna Schmit, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?