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Proceedings Paper

Indoor visible light communication: modeling and analysis of multi-state modulation
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Paper Abstract

The new dynamic direction of wireless networks development is based on the idea of networks utilizing the optical radiation in the visible spectrum VLC (Visible Light Communications). The impulse of this development direction was improvement in the semiconductor lighting technologies, namely the white power LEDs (Light Emitting Diode). These types of wireless networks are denoted as the optical wireless networks for indoor spaces utilizing optical radiation in the visible spectrum. The paper deals with the issue of deployment of multi-state modulations into the indoor visible light communications in LOS (Line of Sight) configuration. The first part of the paper focuses on design of modulation element (SMD LED matrix 3 × 3) and problems connected to deployment of multi-state modulation M-QAM (subcarrier intensity modulation) through this modulation element into the indoor visible light communications (MER). The second part deals with the irradiation distribution in dark room in comparison with real room during used multi-state modulation scheme in both simulation and real measurement.

Paper Details

Date Published: 7 October 2014
PDF: 8 pages
Proc. SPIE 9224, Laser Communication and Propagation through the Atmosphere and Oceans III, 92241I (7 October 2014); doi: 10.1117/12.2063090
Show Author Affiliations
Petr Koudelka, VŠB-Technical Univ. of Ostrava (Czech Republic)
Jan Latal, VŠB-Technical Univ. of Ostrava (Czech Republic)
Petr Siska, VŠB-Technical Univ. of Ostrava (Czech Republic)
Jan Vitasek, VŠB-Technical Univ. of Ostrava (Czech Republic)
Andrej Liner, VŠB-Technical Univ. of Ostrava (Czech Republic)
Radek Martinek, VŠB-Technical Univ of Ostrava (Czech Republic)
Vladimir Vasinek, VŠB-Technical Univ. of Ostrava (Czech Republic)


Published in SPIE Proceedings Vol. 9224:
Laser Communication and Propagation through the Atmosphere and Oceans III
Alexander M. J. van Eijk; Christopher C. Davis; Stephen M. Hammel, Editor(s)

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