Proceedings Paper
High brightness electron sources for MeV ultrafast diffraction and microscopy| Format | Member Price | Non-Member Price |
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Paper Abstract
In this paper we review the present status of MeV electron sources for ultrafast diffraction and microscopy applications
and trace the path forward to improve the spatio-temporal resolution of electron scattering probes.
Paper Details
Date Published: 5 September 2014
PDF: 5 pages
Proc. SPIE 9198, Ultrafast Nonlinear Imaging and Spectroscopy II, 91980S (5 September 2014); doi: 10.1117/12.2062997
Published in SPIE Proceedings Vol. 9198:
Ultrafast Nonlinear Imaging and Spectroscopy II
Zhiwen Liu, Editor(s)
PDF: 5 pages
Proc. SPIE 9198, Ultrafast Nonlinear Imaging and Spectroscopy II, 91980S (5 September 2014); doi: 10.1117/12.2062997
Show Author Affiliations
P. Musumeci, Univ. of California, Los Angeles (United States)
R. K. Li, SLAC National Accelerator Lab. (United States)
Published in SPIE Proceedings Vol. 9198:
Ultrafast Nonlinear Imaging and Spectroscopy II
Zhiwen Liu, Editor(s)
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