
Proceedings Paper
Improvement of defect detection in shearography by using principal component analysisFormat | Member Price | Non-Member Price |
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Paper Abstract
A post-processing technique based on principal components analysis (PCA) is proposed for shearography for defect
detection. PCA allows decomposing a time series of images into a set of images called Empirical Orthogonal Functions
(EOF), each showing features with a given variability in the time series. We have applied PCA on composite samples
containing various defects at different depths and which undergo transient thermal wave. Analyzing the temporal series
shows the shallow defects appearing first whereas the deeper ones appear later. With PCA all the defects appear in one
or two of the EOF, easing the identification of defects.
Paper Details
Date Published: 18 August 2014
PDF: 6 pages
Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 92030L (18 August 2014); doi: 10.1117/12.2062831
Published in SPIE Proceedings Vol. 9203:
Interferometry XVII: Techniques and Analysis
Katherine Creath; Jan Burke; Joanna Schmit, Editor(s)
PDF: 6 pages
Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 92030L (18 August 2014); doi: 10.1117/12.2062831
Show Author Affiliations
Marc P. Georges, Univ. de Liège (Belgium)
Published in SPIE Proceedings Vol. 9203:
Interferometry XVII: Techniques and Analysis
Katherine Creath; Jan Burke; Joanna Schmit, Editor(s)
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